| GFAB Ref |
Category |
OEM |
Model |
Tool/Description |
Qty |
Wafer size |
| GFab003718 |
Metrology / Inspection |
AMRAY |
Sigma-2030 |
Scanning Electron Microscope (SEM) |
1 |
200 |
| GFab003650 |
Metrology / Inspection |
Applied Materials |
|
DR SEM |
1 |
200 |
| GFab003648 |
Metrology / Inspection |
Applied Materials |
COMPASS PRO 200 |
DEFECT INSPECTION |
1 |
200 |
| GFab003654 |
Metrology / Inspection |
Applied Materials |
Compass Pro |
DEFECT REVIEW |
1 |
200 |
| GFab003649 |
Metrology / Inspection |
Applied Materials |
DR SEM |
DEFECT
REVIEW |
1 |
200 |
| GFab003323 |
Metrology / Inspection |
Credence |
SAPPHIRE DEBUG |
|
1 |
200mm |
| GFab003326 |
Metrology / Inspection |
GSI Lumonics |
WAFER MARK 345 |
|
1 |
200mm |
| GFab003331 |
Metrology / Inspection |
JEOL |
JSM-6400F |
|
1 |
200mm |
| GFab003333 |
Metrology / Inspection |
KLA-Tencor |
2131 |
|
1 |
200mm |
| GFab003334 |
Metrology / Inspection |
KLA-Tencor |
2131 |
|
1 |
200mm |
| GFab003335 |
Metrology / Inspection |
KLA-Tencor |
6200 |
|
1 |
200mm |
| GFab003336 |
Metrology / Inspection |
KLA-Tencor |
6200 |
|
1 |
200mm |
| GFab003332 |
Metrology / Inspection |
KLA-Tencor |
2030C |
|
1 |
200mm |
| GFab003337 |
Metrology / Inspection |
KLA-Tencor |
ABI 2000 |
|
1 |
200mm |
| GFab003338 |
Metrology / Inspection |
KLA-Tencor |
AIT |
|
1 |
200mm |
| GFab003284 |
Metrology / Inspection |
KLA-Tencor |
AIT2 |
|
1 |
200mm |
| GFab003339 |
Metrology / Inspection |
KLA-Tencor |
AIT2 |
|
1 |
200mm |
| GFab003340 |
Metrology / Inspection |
KLA-Tencor |
AIT-XP PLUS |
|
1 |
200mm |
| GFab003341 |
Metrology / Inspection |
KLA-Tencor |
AIT-XP PLUS
|
|
1 |
200mm |
| GFab003342 |
Metrology / Inspection |
KLA-Tencor |
CRS-1010S |
|
1 |
200mm |
| GFab003343 |
Metrology / Inspection |
KLA-Tencor |
CRS-1010S |
|
1 |
200mm |
| GFab003344 |
Metrology / Inspection |
KLA-Tencor |
FT750 |
|
1 |
200mm |
| GFab003345 |
Metrology / Inspection |
KLA-Tencor |
HRP340-E |
|
1 |
200mm |
| GFab003346 |
Metrology / Inspection |
KLA-Tencor |
HRP340-E |
|
1 |
200mm |
| GFab003662 |
Metrology / Inspection |
KLA-Tencor |
KLA STEALTH 2360 |
BARE WAFER INSPECTION |
1 |
200 |
| GFab003614 |
Metrology / Inspection |
KLA-Tencor |
KLA TENCOR - ADC manager |
ADC MANAGER |
1 |
200 |
| GFab003607 |
Metrology / Inspection |
KLA-Tencor |
KLA TENCOR ES25 |
DEFECT INSPECTION |
1 |
200 |
| GFab003678 |
Metrology / Inspection |
KLA-Tencor |
KLASURFSCAN SP1 TB1 |
WAFER SCAN TOOL |
1 |
200 |
| GFab003679 |
Metrology / Inspection |
KLA-Tencor |
KLASURFSCAN SP1 TB1 |
WAFER SCAN TOOL |
1 |
200 |
| GFab003664 |
Metrology / Inspection |
KLA-Tencor |
KT ( FLX-5400) |
Stress Measuremnt |
1 |
200 |
| GFab003623 |
Metrology / Inspection |
KLA-Tencor |
KT ( OmniMap RS75) |
RESISTIVITY MEASURE |
1 |
200 |
| GFab003626 |
Metrology / Inspection |
KLA-Tencor |
KT ( RS100) |
RESISTIVITY MEASURE |
1 |
200 |
| GFab003347 |
Metrology / Inspection |
KLA-Tencor |
P-340 |
|
1 |
200mm |
| GFab003285 |
Metrology / Inspection |
KLA-Tencor |
QUANTOX 64100 |
|
1 |
200mm |
| GFab003663 |
Metrology / Inspection |
KLA-Tencor |
TENCORHRP220 |
PROFILER |
1 |
200 |
| GFab003599 |
Metrology / Inspection |
KLA-Tencor |
TENCORSURFSCAN 6200 |
WAFER TEST EQUIPMENT |
1 |
200 |
| GFab003296 |
Metrology / Inspection |
Oxford Inst |
e XL |
|
1 |
200mm |
| GFab003646 |
Metrology / Inspection |
Rigaku |
Rigaku ( SYS 3630) |
X-ray measuremnt |
1 |
200 |
| GFab003374 |
Metrology / Inspection |
Rudolph Technologies |
METAPULSE 200 |
|
1 |
200mm |
| GFab003643 |
Metrology / Inspection |
SDI |
SDIFast 230 Series |
CAPACITANCE VOLTAGE MEASUREMENT |
1 |
200 |
| GFab003383 |
Metrology / Inspection |
 Thermawave |
2600B |
|
1 |
200mm |
| GFab003300 |
Metrology / Inspection |
Tokyo Electron (TEL) |
P8I |
|
1 |
200mm |
| GFab003042 |
Metrology / Inspection |
ACCENT |
QS-2200 |
FT-IR Spectrometer for Epi
Thickness Measurement |
1 |
|
| GFab003706 |
Metrology / Inspection |
Advantest |
T666F |
ESD Tester |
1 |
|
| GFab003528 |
Metrology / Inspection |
Amray |
DRT |
Scanning Electron Microscope |
1 |
200 |
| GFab003156 |
Metrology / Inspection |
Applied Materials |
Compass 200 |
|
1 |
200mm |
| GFab003162 |
Metrology / Inspection |
Applied Materials |
Compass 300 |
|
1 |
200mm |
| GFab003161 |
Metrology / Inspection |
Applied Materials |
Compass Pro 200 |
|
1 |
200mm |
| GFab003165 |
Metrology / Inspection |
Applied Materials |
ComPlus |
|
1 |
200mm |
| GFab003166 |
Metrology / Inspection |
Applied Materials |
NanoSem CD |
|
1 |
200mm |
| GFab003170 |
Metrology / Inspection |
Applied Materials |
OPAL 7830i |
SEM |
1 |
200mm |
| GFab003146 |
Metrology / Inspection |
Applied Materials |
SemVision CX |
|
1 |
200mm |
| GFab003155 |
Metrology / Inspection |
Applied Materials |
SemVision CX |
|
1 |
200mm |
| GFab003163 |
Metrology / Inspection |
Applied Materials |
VeraSem CD |
|
1 |
200mm |
| GFab003164 |
Metrology / Inspection |
Applied Materials |
VeraSem CD |
|
1 |
200mm |
| GFab003434 |
Metrology / Inspection |
APPLIED
MATERIALS |
7830SI |
|
1 |
|
| GFab003439 |
Metrology / Inspection |
APPLIED
MATERIALS |
COMPLUS |
|
1 |
|
| GFab003440 |
Metrology / Inspection |
APPLIED
MATERIALS |
COMPLUS |
|
1 |
|
| GFab003443 |
Metrology / Inspection |
APPLIED
MATERIALS |
EXCITE |
|
1 |
|
| GFab003444 |
Metrology / Inspection |
APPLIED
MATERIALS |
SEMVISION G2 DEFECT REVIEW |
|
1 |
|
| GFab003397 |
Metrology / Inspection |
Bede
Scientific |
Bede Metrix-L |
Xray
Diffractometers in Wafer
Manufacturing Metrology |
1 |
|
| GFab003045 |
Metrology / Inspection |
BIORAD |
Q6 |
Overlay Metrology Tool |
1 |
|
| GFab003046 |
Metrology / Inspection |
BIORAD |
Q7/Q8 |
Overlay Metrology Tool for up to
200mm Wafers, 3ea Available |
1 |
200 |
| GFab003047 |
Metrology / Inspection |
BIORAD |
QS-300 |
 FTIR
Epi Thickness Monitor for up to 150mm Wafers |
1 |
150 |
| GFab003048 |
Metrology / Inspection |
BIORAD |
QS-408M |
FTIR Epi Thickness Monitor for
up to 200mm Wafers |
1 |
200 |
| GFab003520 |
Metrology / Inspection |
Boxer Cross |
BX-10 |
Advanced
Implant Monitor |
1 |
200 |
| GFab003518 |
Metrology / Inspection |
Carl Zeiss |
Beta |
Wafer
Inspection Station |
1 |
200/300 |
| GFab003050 |
Metrology / Inspection |
CDE |
463-OC |
Resistivity Mapping Tool,
150mm-300mm Wafers |
1 |
300 |
| GFab003028 |
Metrology / Inspection |
CDE |
Resmap-168 |
Resistivity Nmapping Tool for up
to 200mm Wafers |
1 |
200 |
| GFab003051 |
Metrology / Inspection |
CDE |
Resmap-168 |
Resistivity Nmapping Tool for up
to 200mm Wafers |
1 |
200 |
| GFab003709 |
Metrology / Inspection |
Credence |
Duo |
Tester 50/100 Mhz Conf. 60Mhz
1digital capture board W/8 pins, 2 abbitary waveform Generator boards for 16
pins AWG. 150mm Credence Duo VLSI 97-127 1 |
1 |
150 |
| GFab003515 |
Metrology / Inspection |
Electroglas |
3001X |
Prober |
1 |
200 |
| GFab003183 |
Metrology / Inspection |
Electroglas |
5300e |
|
1 |
300mm |
| GFab003451 |
Metrology / Inspection |
FEI |
XL830 |
|
1 |
|
| GFab003531 |
Metrology / Inspection |
FEI/Philips |
CM-30 |
Transmission Electron Microscope |
1 |
|
| GFab003519 |
Metrology / Inspection |
Frontier
Seminconductor |
900TG VAC |
Film
Stress Measurment |
1 |
200 |
| GFab003516 |
Metrology / Inspection |
Hewlett
Packard |
HP 4062C/UX |
DC
Parametric Test |
1 |
200 |
| GFab003188 |
Metrology / Inspection |
Hitachi |
IRG-10-T10 |
|
1 |
200mm |
| GFab003189 |
Metrology / Inspection |
Hitachi |
IS-2500 |
|
1 |
200mm |
| GFab003060 |
Metrology / Inspection |
HITACHI |
S-6000 |
 Field
Emission CDSEM |
1 |
|
| GFab003061 |
Metrology / Inspection |
HITACHI |
S-7000 |
CD SEM Measurement Tool |
1 |
|
| GFab003454 |
Metrology / Inspection |
HITACHI |
S-8820 |
|
1 |
|
| GFab003455 |
Metrology / Inspection |
HITACHI |
S-8820 |
|
1 |
|
| GFab003456 |
Metrology / Inspection |
HSEB ZEISS |
AXIOSPECT 200 |
|
1 |
|
| GFab003198 |
Metrology / Inspection |
INS |
MIS-200 |
|
1 |
200mm |
| GFab003524 |
Metrology / Inspection |
JEOL |
JWS 7550 |
Wafer
Inspection System |
1 |
200 |
| GFab003190 |
Metrology / Inspection |
Jeol |
JWS-7500-E |
|
1 |
200mm |
| GFab003062 |
Metrology / Inspection |
JEOL |
JWS-7505ZH |
CD-SEM |
1 |
|
| GFab003193 |
Metrology / Inspection |
KLA-Tencor |
2138-XP |
|
1 |
200mm |
| GFab003192 |
Metrology / Inspection |
KLA-Tencor |
8000-AIT |
|
1 |
200mm |
| GFab003069 |
Metrology / Inspection |
KLA-TENCOR |
AlphaStep 200 |
 Profilometer |
1 |
|
| GFab003070 |
Metrology / Inspection |
KLA-TENCOR |
AlphaStep 300 |
Profilometer |
1 |
|
| GFab003399 |
Metrology / Inspection |
KLA-Tencor |
CRS 3000 |
Patterned Wafer
Inspection in Surface Inspection |
1 |
|
| GFab003400 |
Metrology / Inspection |
KLA-Tencor |
CRS 3000 |
Patterned Wafer
Inspection in Surface Inspection |
1 |
|
| GFab003401 |
Metrology / Inspection |
KLA-Tencor |
CRS 3000 |
Patterned Wafer
Inspection in Surface Inspection |
1 |
|
| GFab003035 |
Metrology / Inspection |
KLA-TENCOR |
CRS-1010 |
Confocal Review Station |
1 |
|
| GFab003071 |
Metrology / Inspection |
KLA-TENCOR |
CRS-1010 |
Confocal Review Station |
1 |
|
| GFab003072 |
Metrology / Inspection |
KLA-TENCOR |
CRS-3000 |
Confocal Review Station for up
to 300mm Wafers |
1 |
300 |
| GFab003191 |
Metrology / Inspection |
KLA-Tencor |
FT-700 |
|
1 |
200mm |
| GFab003073 |
Metrology / Inspection |
KLA-TENCOR |
FT-750 |
Film Thickness Inspection System |
1 |
|
| GFab003074 |
Metrology / Inspection |
KLA-TENCOR |
P-2 |
Long Scan Profiler |
1 |
|
| GFab003075 |
Metrology / Inspection |
KLA-TENCOR |
P-2H |
Long Scan Profiler with Cassette
to Cassette Wafer Handling, for up to 200mm Wafers |
1 |
|
| GFab003076 |
Metrology / Inspection |
KLA-TENCOR |
RS55 |
Resistivity Mapping Tool, for
Copper Only |
1 |
|
| GFab003077 |
Metrology / Inspection |
KLA-TENCOR |
Surfscan 6200 |
Unpatterned Wafer Surface
Inspection Tool, for 100mm-200mm Wafers |
1 |
200 |
| GFab003078 |
Metrology / Inspection |
KLA-TENCOR |
Surfscan 7700 |
Patterned Wafer Surface
Inspection Tool |
1 |
|
| GFab003079 |
Metrology / Inspection |
KLA-TENCOR |
Surfscan 7700 |
Patterned Wafer Surface
Inspection Tool |
1 |
|
| GFab003080 |
Metrology / Inspection |
KLA-TENCOR |
Surfscan AIT 8010 |
Patterned Wafer Surface
Inspection Tool |
1 |
|
| GFab003081 |
Metrology / Inspection |
KLA-TENCOR |
Surfscan AIT 8020 |
Patterned Wafer Surface
Inspection Tool |
1 |
|
| GFab003459 |
Metrology / Inspection |
KLA-TENCOR |
2138 |
|
1 |
|
| GFab003460 |
Metrology / Inspection |
KLA-TENCOR |
5300 |
|
1 |
|
| GFab003461 |
Metrology / Inspection |
KLA-TENCOR |
AIT |
|
1 |
|
| GFab003462 |
Metrology / Inspection |
KLA-TENCOR |
AIT |
|
1 |
|
| GFab003463 |
Metrology / Inspection |
KLA-TENCOR |
AIT XP+ |
|
1 |
|
| GFab003464 |
Metrology / Inspection |
KLA-TENCOR |
ALPHA-STEP 200 |
|
1 |
|
| GFab003465 |
Metrology / Inspection |
KLA-TENCOR |
ARCHER AIM + |
|
1 |
|
| GFab003466 |
Metrology / Inspection |
KLA-TENCOR |
CRS-1200 |
|
1 |
|
| GFab003467 |
Metrology / Inspection |
KLA-TENCOR |
FLX 2320 |
|
1 |
|
| GFab003468 |
Metrology / Inspection |
KLA-TENCOR |
HRP 220 |
|
1 |
|
| GFab003469 |
Metrology / Inspection |
KLA-TENCOR |
QUANTOX |
|
1 |
|
| GFab003470 |
Metrology / Inspection |
KLA-TENCOR |
RS-100 |
|
1 |
|
| GFab003471 |
Metrology / Inspection |
KLA-TENCOR |
RS-35 |
|
1 |
|
| GFab003472 |
Metrology / Inspection |
KLA-TENCOR |
RS-35 |
|
1 |
|
| GFab003473 |
Metrology / Inspection |
KLA-TENCOR |
RS-55TC |
|
1 |
|
| GFab003474 |
Metrology / Inspection |
KLA-TENCOR |
SPECTRA FX 100 |
|
1 |
|
| GFab003719 |
Metrology / Inspection |
KLA-TENCOR |
SPECTRA FX 200-Thin Film Metrology |
|
1 |
|
| GFab003475 |
Metrology / Inspection |
KLA-TENCOR |
SPECTRAMAP 300 |
|
1 |
|
| GFab003476 |
Metrology / Inspection |
KLA-TENCOR |
SURFSCAN 6200 |
|
1 |
|
| GFab003477 |
Metrology / Inspection |
KLA-TENCOR |
SURFSCAN 6400 |
|
1 |
|
| GFab003478 |
Metrology / Inspection |
KLA-TENCOR |
SURFSCAN SP1 |
|
1 |
|
| GFab003479 |
Metrology / Inspection |
KLA-TENCOR |
SURFSCAN SP1 |
|
1 |
|
| GFab003489 |
Metrology / Inspection |
MSP CORP |
2300D |
|
1 |
|
| GFab003088 |
Metrology / Inspection |
NANOMETRICS |
Nanoline CD-50 |
CD Measurement Tool |
1 |
|
| GFab003089 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 181 |
Film Thickness Measurement
System |
1 |
|
| GFab003090 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 181 |
Film Thickness Measurement
System |
1 |
|
| GFab003036 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 200 |
Film Thickness Measurement
System with Irvine Optical Wafer Loader |
1 |
|
| GFab003091 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 200 |
Film Thickness Measurement
System with Irvine Optical Wafer Loader |
1 |
|
| GFab003092 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 212 |
Film Thickness Measurement
System with Irvine Optical Wafer Loader |
1 |
|
| GFab003093 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 8300 |
Automatic Film Thickness Tool,
Cassette to Cassette for up to 200mm Wafers |
1 |
|
| GFab003094 |
Metrology / Inspection |
NANOMETRICS |
Nanospec 9000i |
Automatic In Situ Film CMP
Thickness Tools, 3ea Available |
3 |
|
| GFab003490 |
Metrology / Inspection |
NANOMETRICS
|
8300XSE |
|
1 |
|
| GFab003491 |
Metrology / Inspection |
NANOMETRICS
|
ATLAS-CD |
|
1 |
|
| GFab003095 |
Metrology / Inspection |
NIKON |
Optistation 2A |
Automatic Wafer Inspection
Systems for 75mm- 150mm Wafers, Auto Focus, 4ea Available |
1 |
150 |
| GFab003096 |
Metrology / Inspection |
NIKON |
Optistation 3 |
Automatic Wafer Inspection
Systems for 150mm Wafers |
1 |
150 |
| GFab003097 |
Metrology / Inspection |
NIKON |
Optistation 3A |
Automatic Wafer Inspection
Station for 200mm Wafers |
1 |
200 |
| GFab003492 |
Metrology / Inspection |
NIKON |
NSR2205I14E |
|
1 |
|
| GFab003402 |
Metrology / Inspection |
Nikon |
OptiStation
|
Wafer Inspection
Microscopes in Microscopes |
1 |
|
| GFab003098 |
Metrology / Inspection |
NITTO DENKO |
D-304 |
Automatic Wafer Taper |
1 |
|
| GFab003099 |
Metrology / Inspection |
NITTO DENKO |
H-304 |
Automatic Wafer Detaper |
1 |
|
| GFab003517 |
Metrology / Inspection |
Olympus |
FR3200 |
Wafer
Inspection Station |
1 |
300 |
| GFab003105 |
Metrology / Inspection |
PHILIPS |
SPW-2800 |
Xray Fluorescence Metrology Tool
for up to 200mm Wafers |
1 |
200 |
| GFab003498 |
Metrology / Inspection |
PHILIPS |
TREX_610T |
|
1 |
|
| GFab003107 |
Metrology / Inspection |
PROMETRIX |
FT-750 |
Film Thickness Measuring Tool |
1 |
|
| GFab003108 |
Metrology / Inspection |
RIGAKU |
3630 |
TXRF Wafer Analyzer |
1 |
|
| GFab003109 |
Metrology / Inspection |
RIGAKU |
3630 |
TXRF Wafer Analyzer |
1 |
|
| GFab003110 |
Metrology / Inspection |
RIGAKU |
3750 |
TXRF Wafer Analyzer |
1 |
|
| GFab003419 |
Metrology / Inspection |
Rigaku |
3620XRF |
X-Ray Analyzer |
1 |
|
| GFab003111 |
Metrology / Inspection |
RIGAKU |
3700H |
TXRF Wafer Analyzer |
1 |
|
| GFab003112 |
Metrology / Inspection |
RIGAKU |
DPGS |
Xray Diffractometer, 2ea
Available |
2 |
|
| GFab003499 |
Metrology / Inspection |
RUDOLPH |
METAPULSE 200 |
|
1 |
|
| GFab003207 |
Metrology / Inspection |
Rudolph Technologies |
Metapulse 200 |
|
1 |
200mm |
| GFab003037 |
Metrology / Inspection |
SDI |
FAaST-330 |
SPV,
Ultimate SPV, PDM, SILC and other Test Capabilities, 300mm - |
1 |
|
| GFab003113 |
Metrology / Inspection |
SDI |
FAaST-330 |
Dielectric Charaterization Tool
with COCOS, SILC & Epi-t for up to 300mm Wafers |
1 |
|
| GFab003114 |
Metrology / Inspection |
SDI |
FAaST-330 |
SPV,
Ultimate SPV, PDM, SILC and other Test Capabilities, 300mm - |
1 |
|
| GFab003115 |
Metrology / Inspection |
SDI |
PDM |
Plasma Damage Monitor, for up to
300mm Wafers |
1 |
300 |
| GFab003116 |
Metrology / Inspection |
SDI |
SPV-300 |
Surface Photo Voltage Tester for
up to 300mm Wafers |
1 |
300 |
| GFab003380 |
Metrology / Inspection |
Teradyne |
AOI |
|
1 |
200mm |
| GFab003130 |
Metrology / Inspection |
TENCOR |
AlphaStep 200 |
Profilometer |
1 |
|
| GFab003131 |
Metrology / Inspection |
TENCOR |
M-Gage 300 |
Resistivity Monitor |
1 |
|
| GFab003132 |
Metrology / Inspection |
TENCOR |
Surfscan 4000 |
Unpatterned Wafer Surface
Inspection Tool - Parts Tool Only |
1 |
|
| GFab003133 |
Metrology / Inspection |
TENCOR |
Surfscan 4500 |
Unpatterned Wafer Surface
Inspection Tool, for 75mm-150mm Wafers |
1 |
150 |
| GFab003254 |
Metrology / Inspection |
Thermawave |
Optiprobe 2600 |
|
1 |
200mm |
| GFab003256 |
Metrology / Inspection |
Thermawave |
Optiprobe 2600 |
|
1 |
200mm |
| GFab003252 |
Metrology / Inspection |
Thermawave |
Optiprobe 2600 DUV |
|
1 |
200mm |
| GFab003250 |
Metrology / Inspection |
Thermawave |
Optiprobe 3260 DUV |
|
1 |
200mm |
| GFab003253 |
Metrology / Inspection |
Thermawave |
Optiprobe 3260 DUV |
|
1 |
200mm |
| GFab003251 |
Metrology / Inspection |
Thermawave |
Optiprobe 5240 |
|
1 |
200mm |
| GFab003255 |
Metrology / Inspection |
Thermawave |
Optiprobe 5240 |
|
1 |
200mm |
| GFab003507 |
Metrology / Inspection |
THERMA-WAVE
|
OPTI-PROBE 5240I |
|
1 |
|
| GFab003510 |
Metrology / Inspection |
TOKYO
ELECTRON |
P8LC |
|
1 |
|
| GFab003511 |
Metrology / Inspection |
TOKYO
ELECTRON |
P8XL |
|
1 |
|
| GFab003135 |
Metrology / Inspection |
TSK |
APM-90A |
Automatic Wafer Prober, for up
to 200mm Wafers |
1 |
200 |
| GFab003136 |
Metrology / Inspection |
TSK |
UF-200 |
Automatic Wafer Prober, for up
to 200mm Wafers |
1 |
200 |
| GFab003137 |
Metrology / Inspection |
ULTRACISION |
880 |
8" Semi-Automatic
Analytical Wafer Prober |
1 |
200 |
| GFab003138 |
Metrology / Inspection |
VEECO |
Dektak I |
Profilometer |
1 |
|
| GFab003139 |
Metrology / Inspection |
VEECO |
Dektak II |
Profilometer, Controller Only,
Controller Tool |
1 |
|
| GFab003140 |
Metrology / Inspection |
VEECO |
Dektak IIA |
Profilometer |
1 |
|
| GFab003421 |
Metrology / Inspection |
Veeco |
DEKTAK-SXM320 |
Atomic
Force Microscope |
1 |
|
| GFab003141 |
Metrology / Inspection |
VEECO |
SXM-320 |
Atomic Force Microscope |
1 |
|
| GFab003260 |
Metrology / Inspection |
Veeco |
VX210-2 |
Profilometer |
1 |
200mm |
| GFab003512 |
Metrology / Inspection |
VEECO |
DEKTAK 200-SI |
|
1 |
|
| GFab003513 |
Metrology / Inspection |
VEECO |
DEKTAK 200-SL |
|
1 |
|
| GFab003514 |
Metrology / Inspection |
VEECO |
DEKTAK SXM-320 |
|
1 |
|
| GFab003041 |
Metrology / Inspection |
ZEISS |
Axiotron |
5X, 20X 100X, 150X B/Dfield,
Nidek IM-14 Wafer Loader - Call for More Details |
1 |
|
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